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Chen XJ, Yang LZ, Deng ZH, Fan WC (2000) Journal of Infrared and Millimeter Waves 19(6), 463-466.
Date: 2011-08-15   Author: SKLFS  ,   Source: WOS  ,
 

Chen XJ, Yang LZ, Deng ZH, Fan WC (2000) Test and diagnosis of electric circuitry by IR thermal imaging. Journal of Infrared and Millimeter Waves 19(6), 463-466. [In Chinese]

Web link: Keywords:

electric circuitry, infrared thermal image, diagnosis, modeling,

Abstract: A model of IR thermal diagnosis for electric circuitry was established. The temperature profile on the circuitry surface was measured by a thermal video system. And then the inner metallic conductor's temperature was calculated through the developed model to find hidden troubles of malfunction and fire in early stage. A model simulating the different running conditions of the circuitry was also developed to extend the application scope.

 
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